MSE 405 - X-ray Diffraction

3 Credit Hours

This course will cover the central concepts of X-ray diffraction techniques important in the structural characterization of modern inorganic, metallic and polymer materials. Topics include the physics of X-ray generation, basics of instrumentation, symmetry of crystals, reciprocal lattice and application to definition of structures, crystal structure determination, and size, strain, and texture analysis of profile data. Complementary scattering techniques will be introduced.

(RE) Prerequisite(s): MSE 360 or MSE 367
Registration Permission: Consent of instructor.

Undergraduates

Graduate Students

MSE 405 - X-ray Diffraction