| |
Dec 21, 2024
|
|
|
|
|
MSE 680 - Advanced Transmission Electron Microscopy3 Credit Hours
Advanced electron diffraction methods, that use dynamic diffraction contrast and higher order Laue zones especially in convergent beam electron diffraction. High resolution electron microscopy and its image simulations. Atomic resolution Z-contrast and analytical transmission electron microscopy. This course requires a basic understanding of TEM and crystallography and will concentrate on analysis of data with free software. This class will focus on simulation and quantification of EELS spectra, and simulation and interpretation of atomic resolution imaging and diffraction pattern.
Recommended Background: 405 or 511 or 572, 672 or 673.
Registration Restriction(s): Minimum student level – graduate.
Registration Permission: Consent of instructor.
Add to Portfolio (opens a new window)
|
|
