MSE 572 - X-Ray Diffraction

3 Credit Hours

Will cover the central concepts of X-ray diffraction techniques important in the structural characterization of modern inorganic, metallic and polymer materials. Topics include the physics of X-ray generation, basics of instrumentation, symmetry of crystals, reciprocal lattice and application to definition of structures, crystal structure determination, and size, strain, and texture analysis of profile data. Complementary scattering techniques will also be introduced.
Credit Restriction: Students cannot receive credit for both MSE 405 and MSE 572.

Undergraduates

Graduate Students

MSE 572 - X-Ray Diffraction