MSE 405 - Structural Characterization of Materials

3 Credit Hours

Crystal structures and the reciprocal lattice and how the atomic parameters relate to X-ray and neutron diffraction data. Production of X-rays and overview of hardware, data collection, and data analysis software and techniques.

Satisfies General Education Requirement: (WC)
(RE) Prerequisite(s): Physics 232.
Registration Permission: Consent of instructor.