Apr 24, 2024  
2016-2017 Graduate Catalog 
    
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2016-2017 Graduate Catalog [ARCHIVED CATALOG]

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MSE 673 - Introduction to Scanned Probe Microscopies

3 Credit Hours
A survey of techniques for surface imaging and characterization. Young’s Topografiner, field emission, and the beginning of scanning tunneling microscopy (STM). Practical operation of the STM (includes laboratory sessions). Image resolution and interpretation in the STM, analytical STM imaging. The theory and control of feedback loops in SPM. The generalized Scanning Probe Microscope (SPM) and the Atomic Force Microscope (AFM). Theory of operation of AFM, limits to resolution, and image interpretation (includes laboratory session). Important variants of the SPM including scanning capacitance, scanning near field optical, and scanning thermal microscopes. The metrology of nanoscale structures.
Registration Restriction(s): Minimum student level – graduate.
Registration Permission: Consent of instructor.


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